Advantest: 93k Tester Manual ((better))

| Feature Category | Key Capabilities & Specifications | | :--- | :--- | | | Pin Scale 1600, Pin Scale 5000B cards handling speeds over 32 Gbps ; addresses AI, High-Performance Computing (HPC) and advanced digital devices. | | RF & Wireless Testing | Wave Scale RF, Wave Scale Millimeter cards. Covers 5G/6G (sub-6 GHz & mmWave up to 70 GHz), Wi-Fi 6E/7, Bluetooth, GPS, and Ultra-Wideband (UWB). | | Mixed-Signal & Power | AVI64 card provides a broad voltage range of -40V to +80V for precision analog testing; DC Scale cards manage currents from milliamps to over 1000A , critical for high-power AI processors and automotive ICs. | | System Architecture | Multi-site efficiency (MSE) up to 99.9% with configurations supporting over 1,024 independent test sites in parallel for massive production throughput. | | Scalability (Classes) | Full compatibility across all A-class (engineering) to L-class (high-volume) test heads, protecting your investment by allowing program and hardware reuse as your needs grow. |

When writing a levels file, always define hard current clamps ( ICCcap I sub cap C cap C end-sub

Dictates the exact execution sequence of various test suites and bins the device based on pass/fail criteria. 3. Developing Digital Vectors and Timing advantest 93k tester manual

Position the wafer prober or package handler so the device makes clean physical contact with the DIB.

Executes during every test loop, triggering hardware and gathering data. | Feature Category | Key Capabilities & Specifications

Deliver precise voltage and current to the Device Under Test (DUT). Manuals detail current clamping, ganging multiple channels for high-current rails, and transient response settings.

Dictates what happens on a pass or fail (e.g., binning, looping, branching to diagnostic flows). 🚀 Step-by-Step: Writing Your First Test Method | | Mixed-Signal & Power | AVI64 card

The primary manual for software navigation, test method coding, and graphical user interface (GUI) operations.