Digital Systems Testing And Testable Design Solution High Quality -

By identifying bugs early in the silicon bring-up phase, companies avoid costly redesigns and "respinning" the chip.

Transition fault testing represents the most common at-speed methodology, applying patterns that launch a transition at one clock edge and capture the result on a subsequent edge. Launch-off-shift and launch-off-capture are the two primary approaches for generating at-speed transitions from scan chains. Each approach offers trade-offs between test coverage, power consumption, and implementation complexity. By identifying bugs early in the silicon bring-up

[ RTL Design Coding ] | v [ DFT Synthesis & Scan Insertion ] <---> [ Design Rule Checking (DRC) ] | v [ ATPG & Fault Simulation ] | v [ Timing Verification (STA) ] | v [ Silicon GDSII Manufacturing ] | v [ ATE Tester Deployment ] By identifying bugs early in the silicon bring-up